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2 article(s) from Rzeznik, Lukasz

Numerical investigation of depth profiling capabilities of helium and neon ions in ion microscopy

Patrick Philipp,
Lukasz Rzeznik and
Tom Wirtz

Beilstein J. Nanotechnol. 2016, 7, 1749–1760, doi:10.3762/bjnano.7.168

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Figure 1: Initial sample composition for a) sample #1, b) sample #2, and c) sample #3. All samples have inter...

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Figure 2: Sample composition as a function of depth and primary ion fluence for 1 keV He⁺ irradiation of samp...

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Figure 3: Sample composition as a function of depth and primary ion fluence for 1 keV He⁺ irradiation of samp...

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Figure 4: Sample composition as a function of depth and primary ion fluence for 20 keV Ne⁺ irradiation of sam...

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Figure 5: Sample composition as a function of depth and primary ion fluence for 20 keV Ar⁺ irradiation of sam...

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Figure 6: Simulated depth profiles for a) 20 keV Ne⁺ irradiation of sample #1 with 10 nm and 20 nm inter-laye...

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Figure 7: Sample composition as a function of depth and primary ion fluence for 1 keV Ne⁺ irradiation of samp...

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Figure 8: Sample composition as a function of depth and primary ion fluence for 1 keV Ne⁺ irradiation of samp...

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Figure 9: Simulated depth profiles for a) 1 keV Ne⁺ irradiation of sample #1, b) 1 keV Ne⁺ irradiation of sam...

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Figure 10: Simulated depth profiles for a) 1 keV Ne⁺ irradiation of sample #2, b) 1 keV Ar⁺ irradiation of sam...

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Full Research Paper

Published 17 Nov 2016

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Experimental and simulation-based investigation of He, Ne and Ar irradiation of polymers for ion microscopy

Lukasz Rzeznik,
Yves Fleming,
Tom Wirtz and
Patrick Philipp

Beilstein J. Nanotechnol. 2016, 7, 1113–1128, doi:10.3762/bjnano.7.104

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Figure 1: Changing topography of PMMA bombarded by 5.5 keV Ne⁺ as a function of fluence (FOV: 1 × 1 µm²).

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Figure 2: RMS roughness changing with primary He⁺ and Ne⁺ fluence when bombarding (a) PMMA and (b) PS.

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Figure 3: Displacement of He, Ne and Ar from their initial positions in HD-PMMA sample at 300 K. No periodic ...

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Figure 4: Mean square displacement (MSD) of helium, neon and argon at 300 K in a) HD-PE, b) HD-PS, c) HD-PMMA...

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Figure 5: Implantation profiles in polyethylene obtained by SD_TRIM_SP for diffusion coefficient ranging from...

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Figure 6: Surface sputtering vs swelling for different diffusion coefficients for helium irradiation of PE.

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Figure 7: Evolution of sputter yields with fluence for a) helium, b) neon, and c) argon bombardment of PE at ...

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Figure 8: Evolution of sputter yields with fluence for a) helium, b) neon, and c) argon bombardment of PTFE a...

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Figure 9: Evolution of sputter yields with fluence for a) helium, b) neon, and c) argon bombardment of PMMA a...

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Figure 10: Partial sputter yields for the different chemical elements sputtered from a) PTFE, b) PE, c) PMMA, ...

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Figure 11: Surface composition as a function of impact energy for helium, neon and argon bombardment of a) F a...

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Figure 12: Concentration profiles of F and C at a fluence of 10¹⁸ ions/cm² for He, Ne and Ar bombardment of PT...

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Figure 13: Concentration profiles of H and C at a fluence of 10¹⁸ ions/cm² for He, Ne and Ar bombardment of PE...

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Full Research Paper

Published 02 Aug 2016

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